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1. Influence of Se beam pressure on deep-level defects in Cu(In,Ga)Se-2 thin films studied by photocapacitance and time-resolved photoluminescence measurements SCOPUS SCIE EI

作者:Hu, XB;Xue, JJ;Tian, J;Weng, GE;Chen, SQ

通讯作者:Chen, Shaoqiang(sqchen@ee.ecnu.edu.cn)

通讯作者地址:Chen, SQ (reprint author), East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China.

作者机构:[Hu, Xiaobo; Xue, Juanjuan; Tian, Jiao; Weng, Guoen; Chen, Shaoqiang] East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China.

来源:APPLIED OPTICS,2017,56,5,1291-1295

收录类别:SCOPUS;SCIE;EI

当年影响因子:1.65

资源类型:外文期刊论文

2. Cation-Mutation Design of Quaternary Nitride Semiconductors Lattice-Matched to GaN SCOPUS SCIE EI

作者:Cai, ZH;Narang, P;Atwater, HA;Chen, SY;Duan, CG;Zhu, ZQ;Chu, JH

通讯作者:Chen, Shiyou

通讯作者地址:Chen, SY (reprint author), E China Normal Univ, Key Lab Polar Mat & Devices MOE, Shanghai 200241, Peoples R China.

作者机构:[Cai, Zeng-Hua; Chen, Shiyou; Duan, Chun-Gang; Zhu, Zi-Qiang; Chu, Jun-Hao] E China Normal Univ, Key Lab Polar Mat & Devices MOE, Shanghai 200241, Peo 更多

来源:CHEMISTRY OF MATERIALS,2015,27,22,7757-7764

收录类别:SCOPUS;SCIE;EI

当年影响因子:9.466

WOS被引:3

Scopus被引:6

资源类型:外文期刊论文

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