标题:Contactless angle measurement by CMOS process with on chip interface circuit
作者:Yan, C[1];Yang, XF[1];Lai, ZS[1]
通讯作者地址:Yan, C (reprint author), E China Normal Univ, Dept Elect Engn, Shanghai 200062, Peoples R China.
出版年:1998
页码:887-890
会议时间:OCT 21-23, 1998
会议地点:BEIJING, PEOPLES R CHINA
会议名称:5th International Conference on Solid-State and Integrated Circuit; Technology
摘要:Contactless magnetic-sensitive two-dimensional angle detector system can be used in harsh environments when longer operating lifetime and better relia 更多
收录类别:SCIE;CPCI-S
语种:English
资源类型:外文会议论文
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版本类型: 出版稿
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使用许可: CC BY-NC-SA
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