标题:Effect of Low-Temperature on Endurance Characteristics of SONOS Memory
作者:Liu, LJ[1];Shen, GF[];Cao, G[];Zhang, SB[1];Shi, YL[1]
作者全称:Liu, Lijuan[1];Shen, Guofei[];Cao, Gang[];Zhang, Shunbin[1];Shi, Yanling[1]
通讯作者:Liu, L.
通讯作者地址:Liu, LJ (reprint author), E China Normal Univ, Dept Microelect, Shanghai 200062, Peoples R China.
出版年:2013
卷:52
期:1
页码:959-964
摘要:The endurance characteristics of SONOS nonvolatile memory are investigated in a temperature range from -40 degrees C to 85 degrees C. The erase/progra 更多
收录类别:SCOPUS;CPCI-S;EI
资源类型:外文期刊论文;外文会议论文
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使用许可: CC BY-NC-SA
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